OE 495 - Optical Metrology
- Credit Hours: 3.5R-1.5L-4C
- Term Available: W
- Graduate Studies Eligible: No
- Prerequisites: OE 280 and OE 392
- Corequisites: None
Geometrical test methods (refractometers, knife edge, Ronchi, Wire, Hartmann). Review of interference and coherence. Third-order aberrations, Zernike polynomials, and fringe analysis. Interferometers (Newton, Fizeau, Twyman-Green, and shearing), fringe localization, and phase shifting. Holographic, Moire, photoelastic and speckle interferometry. Applications of optical metrology. Relevant laboratory experiments.